<p>When mounted inside the traction inverter, TI’s TMCS2100-Q1 multi-axial coreless Hall-effect current sensor enables more efficient, longer-range, and more enjoyable driving experiences for HEVs and EVs.</p>
As the cost of test rises with complexity of AI and other advanced devices, system-level test with integrated test cells is becoming a foundational approach.
As semiconductor devices grow more complex, scalable switching architectures become essential for balancing signal integrity, throughput, synchronization, and long-term test-system flexibility.
Carlo Manfredini from Emona Instruments demonstrates how the Controls Explorer Board (CONTEx) brings complex mathematical concepts to life on NI's learning platform.
Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process variation and sorting dies at wafer level.
Danisense's latest high-precision DC and AC current clamp-on handles galvanically isolated measurements up to 500 A with a current measurement accuracy of Β±0.1%.
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